Arup K. George, Wooyoon Shim, Minkyu Je and Junghyup Lee, “A 114-aFrms-Resolution 46-nF/10-MΩ-Range Digital-Intensive Reconfigurable RC-to-Digital Converter with Parasitic-Insensitive Femto-Farad Baseline Sensing,” Proc. IEEE Symp. VLSI Circuits (VLSIC), Jun. 2018. (One of the world’s 3 top semiconductor conferences)

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